1st Italian EELS school


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The 1st Italian EELS School is an intensive 4-day training school that incorporates lectures, computer laboratories, and microscope practicals to provide participants with comprehensive, hands-on training on key EELS and EFTEM topics and technology. The practical lessons will be made at the new Beyond-Nano Sub-Ångstom Lab on integrated JEOL GIF/EELS systems: a JEOL 2010F FEG and a probe corrected JEOL ARM 200F equipped with a C-FEG and a fully loaded last generation GIF Quantum ER as EELS spectrometer. Thanks to the Transmission electron microscopy (TEM) nowadays we can reveals details of natural and man-made structures even at sub-nanometer scale. Energy-Filtered TEM (EFTEM) and electron energy-loss spectroscopy (EELS) are the ideal analytical tools to the high spatial resolution provided by TEM in both the conventional and scanned (STEM) imaging modes.

This course reviews the basic theory and practice of EELS imaging and analysis in the TEM. Some prior experience with electron microscopy and analytical techniques is recommended. By the end of the course, participants can expect to know how best to optimize the performance of their EELS hardware as well as their EELS and EFTEM experimental setups in order to capture and extract the maximum amount of information from their TEM samples.


  • Fundamentals of EELS and energy-Filtered imaging in TEM

  • Optimization of EFTEM and EELS data acquisition

  • Quantification of elemental composition

  • Other information provided by EFTEM/EELS and how best to extract it

  • Use of EELS signals to form maps of elemental and chemical composition

  • EFTEM and STEM EELS spectrum imaging techniques

  • Atomic EELS analysis Identification of material phases via EELS fine structure mapping

  • Advanced data processing DFT modelling and application to the experiment.

Invited teachers

The course is limited to 16 participants.


You can sign up by April 20th, 2014, by completing and sending the application form<\strong> pdf , doc. by email (giuseppe.nicotra@imm.cnr.it and balboni@bo.imm.cnr.it), together with a copy of the payment of the registration fee. Registration fees include access to school, educational materials, coffee breaks and lunches in the cafeteria. There is a discount for SISM ​​members who have been registered on 30 April 2014.


  • Full quota € 500 + VAT (23%)

  • SISM members ​​€ 450 + VAT (23%)

For the payment will be issued an invoice. Please note that for employees of public institutions the fee is exempt from VAT (Article 10 of DPR 633/72). Registration fees may be paid through:

Credit card Please note that the credit card payment will be redirected to the SISM website ​​(Italian Society for Microscopy Sciences), co-organizer of the event

Bank transfer

Account Holder: S.I.S.M.​​

IBAN: IT 43 Q 02008 02455 000103039142


address: Unicredit - Ag. Dante, Bologna

reference: "Name of the participant + EELSschool2014"

Who will bind request SISM ​​will be exempted from the payment of the membership fee for the year 2014.

click to download the flyer

Directors of the school




Participant receives discounted rate for rooms at selected hotel.

Please take notes that the offer is limited for rooms booked until 30/04/2014 at


We advice that the availability of rooms is very limited for the date of the school in Catania.

For the transfer, a shuttle bus will be available the days of the school stopping nearby the hotel.